SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials-Reference-Cited by-同舟云学术

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SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials

Published:2010-07-09 Issue:10-11 Volume:42 Page:1612-1615
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Matsuo Jiro,Ninomiya Satoshi,Yamada Hideaki,Ichiki Kazuya,Wakamatsu Yoshinobu,Hada Masaki,Seki Toshio,Aoki Takaaki

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3585/fullpdf

Reference14 articles.

1. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

2. The Magic of Cluster SIMS

3. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

4. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

5. Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

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2. Innovative Technologies in Advanced SIMS : Toward Organic and Biological Material Analysis;Vacuum and Surface Science;2021-10-10

3. Identification of Synthetic Organic Pigments (SOPs) Used in Modern Artist’s Paints with Secondary Ion Mass Spectrometry with MeV Ions;Analytical Chemistry;2020-06-02

4. Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging;Journal of Vacuum Science & Technology B;2020-05

5. Development of MeV TOF-SIMS capillary microprobe at the Ruđer Bošković Institute in Zagreb;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-12

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