Ar cluster sputtering of polymers: effects of cluster size and molecular weights-Reference-Cited by-同舟云学术

Ar cluster sputtering of polymers: effects of cluster size and molecular weights

Published:2014-03-03 Issue:S1 Volume:46 Page:79-82
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Cristaudo Vanina¹,Poleunis Claude¹,Czerwinski Bartlomiej¹,Delcorte Arnaud¹

Affiliation:

1. Institute of Condensed Matter and Nanosciences - Bio and Soft Matter (IMCN/BSMA); Université catholique de Louvain; 1 Croix du Sud box L7.04.01 B-1348 Louvain-la-Neuve Belgium

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

1. Cluster secondary ion mass spectrometry of polymers and related materials

2. Chemical effects in C60 irradiation of polymers

3. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

4. Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment

5. 046001-0460013;Moritani;Appl. Phys. Express,2009

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion-photon emission under bombardment of Ta target with cluster and multiply charged Bi ions;Vacuum;2023-07

2. Theory and molecular simulations of plasma sputtering, transport and deposition processes;The European Physical Journal D;2023-02

3. Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs + sputtering;Surface and Interface Analysis;2021-07-21

4. Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolution;Surface and Interface Analysis;2021-07-06

5. Ion yield enhancement at the organic/inorganic interface in SIMS analysis using Ar-GCIB;Applied Surface Science;2021-01