Functional Modifications Induced via X‐ray Nanopatterning in TiO 2 Rutile Single Crystals-Reference-Cited by-同舟云学术

Functional Modifications Induced via X‐ray Nanopatterning in TiO 2 Rutile Single Crystals

Published:2021-09-15 Issue:10 Volume:15 Page:2100409
ISSN:1862-6254
Container-title:physica status solidi (RRL) – Rapid Research Letters
language:en
Short-container-title:Phys. Status Solidi RRL

Author:

Alessio Andrea¹,Bonino Valentina²^ORCID,Heisig Thomas³⁴^ORCID,Picollo Federico¹^ORCID,Torsello Daniele⁵⁶^ORCID,Mino Lorenzo⁷^ORCID,Martinez-Criado Gema⁸^ORCID,Dittmann Regina³⁴^ORCID,Truccato Marco¹^ORCID

Affiliation:

1. Department of Physics, Interdepartmental Centre NIS University of Torino via P. Giuria 1 I-10125 Torino Italy

2. European Synchrotron Radiation Facility – Experiments Division 71 Avenue des Martyrs F-38000 Grenoble France

3. Forschungszentrum Juelich GmbH Peter Gruenberg Institute 7 D-52425 Juelich Germany

4. JARA-FIT RWTH Aachen University D-52056 Aachen Germany

5. Department of Applied Science and Technology Politecnico di Torino 10129 Turin Italy

6. Istituto Nazionale di Fisica Nucleare Sezione di Torino 10125 Turin Italy

7. Department of Chemistry, Interdepartmental Centre NIS and INSTM Centro di Riferimento University of Torino via P. Giuria 7 I-10125 Torino Italy

8. Instituto de Ciencia de Materiales de Madrid Consejo Superior de Investigaciones Científicas 28049 Cantoblanco Spain

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202100409

Reference56 articles.

1. M.Anees K.Rahul S. A.Swarnkar S.Yachareni inIEEE 14th Dallas Circuits and Systems Conf. (DCAS) IEEE Piscataway NJ2020 https://doi.org/10.1109/DCAS51144.2020.9330648.

2. Monolithically Integrated Circuits from Functional Oxides

3. The missing memristor found

4. Redox-based memristive devices for new computing paradigm

5. Resistive switching memories based on metal oxides: mechanisms, reliability and scaling

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improving the control of the electroforming process in oxide-based memristive devices by X-ray nanopatterning;Journal of Materials Chemistry C;2024

2. Performance degradation and I–V model of TiO2-film-based resistive switching memory under proton irradiation;Applied Physics Letters;2023-05-22

3. TID Effect and Damage Model of ⁶⁰CO _γ for the TiO₂ Nano-Rod-Based Resistive Switching Memory;IEEE Transactions on Electron Devices;2022-12