Critical Gates Identification for Fault-Tolerant Design in Math Circuits

Author:

Ban Tian12ORCID,Junior Gutemberg G. S.2

Affiliation:

1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

2. Department of Communications and Electronics, Institut Mines-Télécom, Télécom ParisTech, 75013 Paris, France

Abstract

Hardware redundancy at different levels of design is a common fault mitigation technique, which is well known for its efficiency to the detriment of area overhead. In order to reduce this drawback, several fault-tolerant techniques have been proposed in literature to find a good trade-off. In this paper, critical constituent gates in math circuits are detected and graded based on the impact of an error in the output of a circuit. These critical gates should be hardened first under the area constraint of design criteria. Indeed, output bits considered crucial to a system receive higher priorities to be protected, reducing the occurrence of critical errors. The 74283 fast adder is used as an example to illustrate the feasibility and efficiency of the proposed approach.

Funder

National Natural Science Foundation of China

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,General Computer Science,Signal Processing

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