A two‐dimensional RC network topology for fault‐tolerant design of analog circuits-Reference-Cited by-同舟云学术

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A two‐dimensional RC network topology for fault‐tolerant design of analog circuits

Published:2022-04-21 Issue:7 Volume:50 Page:2653-2659
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Circuit Theory & Apps

Author:

Paiva Henrique Mohallem¹^ORCID,Galvão Roberto Kawakami Harrop²^ORCID,Hadjiloucas Sillas³^ORCID,Yoneyama Takashi²^ORCID,Marcolino Matheus Henrique⁴^ORCID

Affiliation:

1. Institute of Science and Technology Universidade Federal de São Paulo São Paulo Brazil

2. Electronics Engineering Division Instituto Tecnológico de Aeronáutica São Paulo Brazil

3. Department of Biomedical Engineering The University of Reading Reading UK

4. Technological Science Institute Universidade Federal de Itajubá Itajubá Brazil

Funder

Conselho Nacional de Desenvolvimento Científico e Tecnológico

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/cta.3299

Reference22 articles.

1. A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model

2. Radiation‐hardened read‐decoupled low‐power 12T SRAM for space applications

3. Survey of Soft Error Mitigation Techniques Applied to LEON3 Soft Processors on SRAM-Based FPGAs

4. Ionizing radiation damage in 65 nm CMOS technology: Influence of geometry, bias and temperature at ultra-high doses

5. Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors

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