Performance Analysis of Modified Drain Gating Techniques for Low Power and High Speed Arithmetic Circuits

Author:

Panwar Shikha1ORCID,Piske Mayuresh1,Madgula Aatreya Vivek1ORCID

Affiliation:

1. School of Electronics Engineering (SENSE), VIT University, Vandalur-Kelambakkam Road, Chennai 600127, India

Abstract

This paper presents several high performance and low power techniques for CMOS circuits. In these design methodologies, drain gating technique and its variations are modified by adding an additional NMOS sleep transistor at the output node which helps in faster discharge and thereby providing higher speed. In order to achieve high performance, the proposed design techniques trade power for performance in the delay critical sections of the circuit. Intensive simulations are performed using Cadence Virtuoso in a 45 nm standard CMOS technology at room temperature with supply voltage of 1.2 V. Comparative analysis of the present circuits with standard CMOS circuits shows smaller propagation delay and lesser power consumption.

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Hardware and Architecture

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dynamic Power Reduction Techniques for CMOS Logics Using 45 nm Technology;International Conference on Intelligent Computing and Smart Communication 2019;2019-12-20

2. Gated body-biased full adder;Materials Today: Proceedings;2018

3. Analysis and Design of Subthreshold Leakage Power-aware Ripple Carry Adder at Circuit-level Using 90nm Technology;Procedia Computer Science;2015

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