Measurement of residual stresses by X-ray diffraction techniques in pyrite films prepared by magnetron sputtering-Reference-Cited by-同舟云学术

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Measurement of residual stresses by X-ray diffraction techniques in pyrite films prepared by magnetron sputtering

Published:2011-10 Issue:5 Volume:15 Page:334-339
ISSN:1432-8917
Container-title:Materials Research Innovations
language:en
Short-container-title:Materials Research Innovations

Author:

Luan Z J¹,Huang Y L¹,Yao D W¹,Meng L¹

Affiliation:

1. Department of Materials Science and EngineeringZhejiang University, Hangzhou 310027, China

Publisher

Informa UK Limited

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.tandfonline.com/doi/pdf/10.1179/143307511X13109310554805

Reference24 articles.

1. Characterization of FeS2-pyrite thin films synthesized by sulphuration of amorphous iron oxide films pre-deposited by spray pyrolysis

2. Crystallographic behavior of FeS2 films formed on different substrates

3. Pyrite (FeS2) thin films deposited by sol–gel method

4. Effects of film thickness on microstructure and electrical properties of the pyrite films

5. Microstructure and optical absorption of FeS2 films formed by sulfurizing precursive iron of various crystallite scales

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Predicting residual stress of aluminum nitride thin-film by incorporating manifold learning and tree-based ensemble classifier;Materials Chemistry and Physics;2023-02

2. Minimizing film residual stress with in situ OES big data using principal component analysis of deposited AlN films by pulsed DC reactive sputtering;The International Journal of Advanced Manufacturing Technology;2021-04-04

3. A comparison of microstructure and mechanical properties of welded thin Ti6Al4V with three different types of laser;Materials Research Innovations;2015-05

4. Residual stress analysis in Al–50Si alloy after laser beam welding by X-ray diffraction;Materials Research Innovations;2013-12-23

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