Ge-Channel Nanosheet FinFETs for Nanoscale Mixed Signal Application
Author:
Affiliation:
1. Department of Electronics and Telecommunication, Parala Maharaja Engineering College, Berhampur, Odisha, 761003, India
2. School of Electronics Engineering, VIT Bhopal University, Bhopal, Madhya Pradesh-466114, India
Abstract
Publisher
BENTHAM SCIENCE PUBLISHERS
Reference8 articles.
1. Verhulst A.S.; Saeidi A.; Stolichnov I.; Alian A.; Iwai H.; Collaert N.; Ionescu A.M.; Experimental details of a steep-slope ferroelectric InGaAs tunnel-FET with high-quality PZT and modeling insights in the transient polarization. IEEE Trans Electron Dev 2020,67(1),377-382
2. Yu E.; Heo K.; Cho S.; Characterization and optimization of inverted-T FinFET under nanoscale dimensions. IEEE Trans Electron Dev 2018,65(8),3521-3527
3. Narendar V.; Mishra R.A.; Analytical modeling and simulation of multigate FinFET devices and the impact of high-k dielectrics on short channel effects (SCEs). Superlattices Microstruct 2015,85,357-369
4. Loubet N.; Hook T.; Montanini P.; Yeung C.W.; Kanakasabapathy S.; Guillom M.; Yamashita T.; Zhang J.; Miao X.; Wang J.; Young A.; Stacked nanosheet gate-all-around transistor to enable scaling beyond FinFET. 2017 Symposium on VLSI Technology Kyoto, Japan, 2017.
5. Samal A.; Pradhan K.P.; Mohapatra S.K.; Improvising the switching ratio through low-k/high-k spacer and dielectric gate stack in 3D FinFET-a simulation perspective. Silicon 2021,13(8),2655-2660
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