Author:
Jone W.-B.,Papachristou C. A.
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Maximum sequence test pattern generators with irreducible characteristic polynomials;Microprocessors and Microsystems;2006-03
2. Multiple-seed tpg structures;IEEE Transactions on Computers;2003-12
3. Linear dependencies in extended LFSMs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2002-07
4. Avoiding linear dependencies in LFSR test pattern generators;Journal of Electronic Testing;1995-04
5. Pseudo-exhaustive built-in TPG for sequential circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1995