Avoiding linear dependencies in LFSR test pattern generators-Reference-Cited by-同舟云学术

Avoiding linear dependencies in LFSR test pattern generators

Published:1995-04 Issue:2 Volume:6 Page:229-241
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Kagaris Dimitrios,Tragoudas Spyros

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00993089.pdf

Reference25 articles.

1. W.-B. Jone and C.A. Papachristou, ?A Coordinated Approach to Partitioning and Test Pattern Generation for Pseudo-exhaustive Testing,?Proc. 26th ACM/IEEE Design Automation Conference, pp. 525?530, 1989.

2. H.-J. Wunderlich and S. Hellebrand, ?Tools and Devices Supporting the Pseudo-Exhaustive Test,?Proc. European Conference on Design Automation, pp. 13?17, 1990.

3. D. Kagaris, F. Makedon, and S. Tragoudas, ?A Method for Pseudo-Exhaustive Test Pattern Generation,?IEEE Transactions on Computer-Aided Design, Vol. 13, no. 9, pp. 1170?1178, 1994.

4. S.W. Golomb,Shift Register Sequences, Aegean Park Press, Laguna Hills, CA, 1982.

5. E.R. Berlekamp,Algebaic Coding Theory, Aegean Park Press, Laguna Hills, CA, 1984.

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