Maximum sequence test pattern generators with irreducible characteristic polynomials-Reference-Cited by-同舟云学术

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Maximum sequence test pattern generators with irreducible characteristic polynomials

Published:2006-03 Issue:2 Volume:30 Page:117-123
ISSN:0141-9331
Container-title:Microprocessors and Microsystems
language:en
Short-container-title:Microprocessors and Microsystems

Author:

Kagaris Dimitri,Aakuthota Rajesh,Verma Anila

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software

Reference16 articles.

1. Digital Systems Testing and Testable Design;Abramovici,1990

2. Calculating the effects of linear dependencies in m-sequences as test stimuli;Bardell;IEEE Transactions on CAD/ICAS,1992

3. Exhaustive bit generation with application to VLSI self-testing;Barzilai;IEEE Transactions on Computers,1983

4. Algebraic Coding Theory;Berlekamp,1984

5. Synthesis of one-dimensional linear hybrid cellular automata;Cattell;IEEE Transactions on CAD/ICAS,1996

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