Evaluating instruction cache vulnerability to transient errors

Author:

Yan Jun1,Zhang Wei1

Affiliation:

1. Southern Illinois University, Carbondale, Carbondale, IL

Abstract

Recent research shows that microprocessors are increasingly susceptible to transient errors. In order to protect microprocessors cost-effectively, the first step is to accurately understand the impact of transient errors on the system reliability. While many research efforts have been focused on studying the vulnerability of data caches and other on-chip hardware components, instruction caches have received less attention. However, instructions are read every cycle, any undetected or uncorrected soft errors in instructions can lead to erroneous computation, wrong control flow or system crash. This paper studies the instruction cache vulnerability by considering both the raw SRAM rate and the cache vulnerability factor. Based on the concept of cache vulnerability factor, we also investigate the impact of different cache configuration parameters on the reliability of instruction caches. We find that on average 67.5% of instruction cache soft errors can be masked by the I-cache itself without impacting other system components. While quantifying the instruction cache vulnerability itself does not solve the reliability problem of instruction cache against transient errors, we believe this work can provide useful insights for designers to develop cost-effective solutions to protect I-caches and to optimally balance the reliability of instruction caches with other system goals, such as cost, performance and energy.

Publisher

Association for Computing Machinery (ACM)

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. ECS an endeavor towards providing similar cache reliability behavior in different programs;Microelectronics Reliability;2024-01

2. On the characterization and optimization of system-level vulnerability for instruction caches in embedded processors;Microprocessors and Microsystems;2015-11

3. Replicating Tag Entries for Reliability Enhancement in Cache Tag Arrays;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2012-04

4. Accurate and Simplified Prediction of L2 Cache Vulnerability for Cost-Efficient Soft Error Protection;IEICE Transactions on Information and Systems;2012

5. Characterizing System-Level Vulnerability for Instruction Caches against Soft Errors;2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems;2011-10

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