On the Restore Time Variations of Future DRAM Memory

Author:

Zhang Xianwei1,Zhang Youtao1,Childers Bruce R.1,Yang Jun1

Affiliation:

1. University of Pittsburgh, Pittsburgh, PA

Abstract

As the de facto main memory standard, DRAM (Dynamic Random Access Memory) has achieved dramatic density improvement in the past four decades, along with the advancements in process technology. Recent studies reveal that one of the major challenges in scaling DRAM into the deep sub-micron regime is its significant variations on cell restore time, which affect timing constraints such as write recovery time. Adopting traditional approaches results in either low yield rate or large performance degradation. In this article, we propose schemes to expose the variations to the architectural level. By constructing memory chunks with different access speeds and, in particular, exploiting the performance benefits of fast chunks, a variation-aware memory controller can effectively mitigate the performance loss due to relaxed timing constraints. We then proposed restore-time-aware rank construction and page allocation schemes to make better use of fast chunks. Our experimental results show that, compared to traditional designs such as row sparing and Error Correcting Codes, the proposed schemes help to improve system performance by about 16% and 20%, respectively, for 20nm and 14nm technology nodes on a four-core multiprocessor system.

Funder

National Science Foundation

Publisher

Association for Computing Machinery (ACM)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. PREMSim: A Resilience Framework for Modeling Traditional and Emerging Memory Reliability;2019 IEEE 27th International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems (MASCOTS);2019-10

2. Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management;ACM Transactions on Design Automation of Electronic Systems;2019-07-31

3. Recovering from Biased Distribution of Faulty Cells in Memory by Reorganizing Replacement Regions through Universal Hashing;ACM Transactions on Design Automation of Electronic Systems;2018-01-24

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