1. R. Radojcic More-than-Moore 2.5D and 3D SiP Integration Springer 2017. R. Radojcic More-than-Moore 2.5D and 3D SiP Integration Springer 2017.
2. Radojcic, R., Nowak, M., and Nakamoto, M ., 2011, "TechTuning: Stress management for 3D Through-Si-Via stacking technologies ", International Workshop on Stress Management for 3D ICs Using Through Silicon Vias, AIP Conf. Proc. 1378 , pp. 5 -- 20 . Radojcic, R., Nowak, M., and Nakamoto, M., 2011, "TechTuning: Stress management for 3D Through-Si-Via stacking technologies", International Workshop on Stress Management for 3D ICs Using Through Silicon Vias, AIP Conf. Proc. 1378, pp. 5--20.
3. Carrier Mobility Shift in Advanced Silicon Nodes Due to Chip-Package Interaction
4. Stress assessment for device performance in three-dimensional IC: linked package-scale/die-scale/feature-scale simulation flow
5. V. Sukharev , A. Kteyan , J. Choy , "An accurate assessment of Chip-Package Interaction is a key factor for designing resilient 3D IC systems", 2019 International 3D Systems Integration Conference (3DIC) , Sedai , Japan , 2019 . V. Sukharev, A. Kteyan, J. Choy, "An accurate assessment of Chip-Package Interaction is a key factor for designing resilient 3D IC systems", 2019 International 3D Systems Integration Conference (3DIC), Sedai, Japan, 2019.