Reliability-aware design to suppress aging-Reference-Cited by-同舟云学术

Reliability-aware design to suppress aging

Published:2016-06-05 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 53rd Annual Design Automation Conference
language:
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Author:

Amrouch Hussam¹,Khaleghi Behnam²,Gerstlauer Andreas³,Henkel Jörg¹

Affiliation:

1. Karlsruhe Institute of Technology, Karlsruhe, Germany

2. Sharif University of Technology, Tehran, Iran

3. University of Texas, Austin

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2897937.2898082

Reference20 articles.

1. "Degradation-Aware Cell Libraries V1.0 " http://ces.itec.kit.edu/dependable-hardware.php "Degradation-Aware Cell Libraries V1.0 " http://ces.itec.kit.edu/dependable-hardware.php

2. V. Santen H. Amrouch J. Martinez M. Nafria J. Henkel "Designing Guardbands for Instantaneous Aging Effects " in DAC 2016 (accepted for publication). 10.1145/2897937.2898006 V. Santen H. Amrouch J. Martinez M. Nafria J. Henkel "Designing Guardbands for Instantaneous Aging Effects " in DAC 2016 (accepted for publication). 10.1145/2897937.2898006

3. Combating Aging with the Colt Duty Cycle Equalizer

4. "BSIM Compact MOSFET Models for SPICE Simulation " http://www-device.eecs.berkeley.edu/bsim/?page=BSIM4 "BSIM Compact MOSFET Models for SPICE Simulation " http://www-device.eecs.berkeley.edu/bsim/?page=BSIM4

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