1. Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
2. Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04
3. Functional Constraints in the Selection of Two-Cycle Gate-Exhaustive Faults for Test Generation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-07
4. Covering Test Holes of Functional Broadside Tests;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
5. Intelligent design automation for 2.5/3D heterogeneous SoC integration;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02