Timing-driven routing for symmetrical array-based FPGAs

Author:

Chang Yao-Wen1,Zhu Kai2,Wong D. F.3

Affiliation:

1. National Chiao Tung Univ., Hsinchu, Taiwan

2. Triscend Corp., Mountain View, CA

3. Univ. of Texas at Austin, Austin

Abstract

In this paper we present a timing-driven router for symmetrical array-based FPGAs. The routing resources in the FPGAs consist of segments of various lengths. Researchers have shown that the number of segments, instead of wirelength, used by a net is the most critical factor in controlling routing delay in an FPGA. Thus, the traditional measure of routing delay on the basis of geometric distance of a signal is not accurate. To consider wirelength and delay simultaneously, we study a model of timing-driven routing rees, arising from the special properties of FPGA routing architectures. Based on the solutions to the routing-tree problem, we present a routing algorithm that is able to utilize various routing segments with global considerations to meet timing constraints. Experimental results show that our approach is very effective in reducing timing violations.

Publisher

Association for Computing Machinery (ACM)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An Optimized GIB Routing Architecture with Bent Wires for FPGA;ACM Transactions on Reconfigurable Technology and Systems;2022-12-22

2. Timing-Driven Placement for FPGAs with Heterogeneous Architectures and Clock Constraints;2021 Design, Automation & Test in Europe Conference & Exhibition (DATE);2021-02-01

3. An Incremental Placement Flow for Advanced FPGAs with Timing Awareness;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021

4. Multilevel Full-Chip Routing With Testability and Yield Enhancement;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2007-09

5. Learning Vector Quantization Neural Networks for LED Wafer Defect Inspection;Second International Conference on Innovative Computing, Informatio and Control (ICICIC 2007);2007-09

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