High-Dimensional Yield Estimation Using Shrinkage Deep Features and Maximization of Integral Entropy Reduction
Author:
Affiliation:
1. Beihang University, Beijing, China
2. Shenzhen University, Shenzhen, China
Funder
Fundamental Research Funds for the Central Universities
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3566097.3567907
Reference15 articles.
1. Efficient yield estimation through generalized importance sampling with application to NBL-assisted SRAM bitcells
2. Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage
3. A Fast and Robust Failure Analysis of Memory Circuits Using Adaptive Importance Sampling Method
4. Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation
5. An Efficient SRAM Yield Analysis and Optimization Method With Adaptive Online Surrogate Modeling
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1. Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints;IEEE Access;2024
2. OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
3. Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09
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