Integrated flow for reverse engineering of nanoscale technologies-Reference-Cited by-同舟云学术

Integrated flow for reverse engineering of nanoscale technologies

Published:2019-01-21 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 24th Asia and South Pacific Design Automation Conference
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Author:

Lippmann Bernhard¹,Werner Michael¹,Unverricht Niklas¹,Singla Aayush¹,Egger Peter¹,Dübotzky Anja¹,Gieser Horst²,Rasche Martin³,Kellermann Oliver³,Graeb Helmut⁴

Affiliation:

1. Infineon Technolgies, Neubiberg, Germany

2. Fraunhofer EMFT, München, Germany

3. Raith GmbH, Dortmund, Germany

4. Technische Universität München, München, Germany

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3287624.3288738

Reference15 articles.

1. K. Briechle and U. Hanebeck. 2001. Template Matching using Fast Normalized Cross Correlation. na K. Briechle and U. Hanebeck. 2001. Template Matching using Fast Normalized Cross Correlation. na

2. G. H. Chisholm S. T. Eckmann C. M. Lain and R. L. Veroff. 1999. Understanding integrated circuits. 26--37 pages. 10.1109/54.765201 G. H. Chisholm S. T. Eckmann C. M. Lain and R. L. Veroff. 1999. Understanding integrated circuits. 26--37 pages. 10.1109/54.765201

3. Michael Eick. 2013. Structure and Signal Path Analysis for Analog and Digital Circuits. https://mediatum.ub.tum.de/doc/1128811/1128811.pdf Michael Eick. 2013. Structure and Signal Path Analysis for Analog and Digital Circuits. https://mediatum.ub.tum.de/doc/1128811/1128811.pdf

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