LithoROC-Reference-Cited by-同舟云学术

LithoROC

Published:2019-01-21 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 24th Asia and South Pacific Design Automation Conference
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Author:

Ye Wei¹,Lin Yibo¹,Li Meng¹,Liu Qiang¹,Pan David Z.¹

Affiliation:

1. UT Austin

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3287624.3288746

Reference52 articles.

1. J. Xu S. Sinha and C. C. Chiang "Accurate detection for process-hotspots with vias and incomplete specification " in IEEE/ACM International Conference on Computer-Aided Design (ICCAD) 2007 pp. 839--846. J. Xu S. Sinha and C. C. Chiang "Accurate detection for process-hotspots with vias and incomplete specification " in IEEE/ACM International Conference on Computer-Aided Design (ICCAD) 2007 pp. 839--846.

2. Y.-T. Yu Y.-C. Chan S. Sinha I. H.-R. Jiang and C. Chiang "Accurate process-hotspot detection using critical design rule extraction " in ACM/IEEE Design Automation Conference (DAC) 2012 pp. 1167--1172. 10.1145/2228360.2228576 Y.-T. Yu Y.-C. Chan S. Sinha I. H.-R. Jiang and C. Chiang "Accurate process-hotspot detection using critical design rule extraction " in ACM/IEEE Design Automation Conference (DAC) 2012 pp. 1167--1172. 10.1145/2228360.2228576

3. S.-Y. Lin J.-Y. Chen J.-C. Li W.-Y. Wen and S.-C. Chang "A novel fuzzy matching model for lithography hotspot detection " in ACM/IEEE Design Automation Conference (DAC) 2013 pp. 68:1--68:6. 10.1145/2463209.2488817 S.-Y. Lin J.-Y. Chen J.-C. Li W.-Y. Wen and S.-C. Chang "A novel fuzzy matching model for lithography hotspot detection " in ACM/IEEE Design Automation Conference (DAC) 2013 pp. 68:1--68:6. 10.1145/2463209.2488817

4. A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection

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