A Unified Framework for Layout Pattern Analysis With Deep Causal Estimation-Reference-Cited by-同舟云学术

A Unified Framework for Layout Pattern Analysis With Deep Causal Estimation

Published:2023-04 Issue:4 Volume:42 Page:1199-1211
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Chen Ran¹^ORCID,Hu Shoubo²,Chen Zhitang²,Zhu Shengyu²^ORCID,Yu Bei¹^ORCID,Li Pengyun³,Chen Cheng³,Huang Yu³,Hao Jianye²

Affiliation:

1. Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, Hong Kong, SAR

2. Noah’s Ark Lab, Huawei, Hong Kong

3. HiSilicon Research and Development Department, HiSilicon, Shenzhen, China

Funder

Huawei

Research Grants Council of Hong Kong, SAR

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Reference26 articles.

3. Exploring simple siamese representation learning;chen;arXiv 2011 10566,2020

4. A simple framework for contrastive learning of visual representations;chen;Proc Int Conf Mach Learn (ICML),2020

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