Affiliation:
1. Arizona State University
2. University of Arizona
Abstract
Timing characterization of standard cells is one of the essential steps in VLSI design. The traditional static timing analysis (STA) tool assumes single input switching models for the characterization of multiple input gates. However, due to technology scaling, increasing operating frequency, and process variation, the probability of the occurrence of multiple input switching (MIS) is increasing. On the other hand, considering all possible MIS scenarios for the characterization of multiple input logic gates, is computationally intensive. To improve the efficiency, this work proposes a finite-point-based characterization methodology for multiple input gates with the effects of MIS. Furthermore, delay variation due to MIS is integrated into the STA flow through propagation of switching windows. The proposed modeling methodology is validated using benchmark circuits at the 45nm technology node for various operating conditions. Experimental results demonstrate significant reduction in computation cost and data volume with less than ∼10% error compared to that of traditional SPICE simulation.
Publisher
Association for Computing Machinery (ACM)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Multi-transition delay test for improving the coverage of cell internal defects;IEICE Electronics Express;2024-08-10
2. Accurate Hybrid Delay Models for Dynamic Timing Analysis;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
3. A Hybrid Delay Model for Interconnected Multi-Input Gates;2023 26th Euromicro Conference on Digital System Design (DSD);2023-09-06
4. Multiple-Input Switching Modeling with Graph Neural Network;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
5. A Simple Hybrid Model for Accurate Delay Modeling of a Multi-Input Gate;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14