Accurate process-hotspot detection using critical design rule extraction
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ACM Press
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Feature Fusion based Hotspot Detection with R-EfficientNet;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12
2. Edge Pair-Based Layout Pattern Matching using Space-filling Curve;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
3. A General Layout Pattern Clustering Using Geometric Matching-based Clip Relocation and Lower-bound Aided Optimization;ACM Transactions on Design Automation of Electronic Systems;2023-10-16
4. Bit-Level Quantization for Efficient Layout Hotspot Detection;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
5. Feature Vectors Based on Wire Width and Distance for Lithography Hotspot Detection;IPSJ Transactions on System and LSI Design Methodology;2023
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