Optimization and Quality Estimation of Circuit Design via Random Region Covering Method

Abstract

Random region covering is a global optimization technique that explores the landscape by introducing multiple random starting points to initiate the local optimization solvers. This study applies the random region covering technique to circuit design automation and proposes a theory to explain why this technique is efficient at searching for the global optimum. In addition to analyzing the efficiency of the random region covering algorithm, the theory gives a probability-based estimation of the goodness of the optimization result. To enhance the efficiency of the random region covering technique, this work evaluates the boundary of top performance regions and proposes a modified random region covering method that only performs the global optimization on the top design region. The results from a large number of mathematical experiments verify the proposed methodology. The optimized designs of a class-E power amplifier and a wide load range operational amplifier outperform both manual designs and other state-of-the-art optimization techniques.