TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime-Reference-Cited by-同舟云学术

TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime

Published:2021-07-11 Issue: Volume: Page:
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Container-title:Proceedings of the 44th International ACM SIGIR Conference on Research and Development in Information Retrieval
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Author:

Craswell Nick¹,Mitra Bhaskar²,Yilmaz Emine³,Campos Daniel⁴,Voorhees Ellen M.⁵,Soboroff Ian⁵

Affiliation:

1. Microsoft, Bellevue, WA, USA

2. Microsoft, Montreal, PQ, Canada

3. University College London, London, United Kingdom

4. University of Illinois, Urbana-Champaign, Urbana-Champaign, IL, USA

5. National Institute of Standards and Technology, Gaithersburg, MD, USA

Publisher

ACM

Link

Reference32 articles.

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