Composition profiling in a binary polymer blend thin film using polarized neutron reflectivity
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1209/epl/i2000-00242-8/pdf
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell;Nanoscale;2023
2. Structure and pH-Induced Swelling of Polymer Films Prepared from Sequentially Grafted Polyelectrolytes;Langmuir;2022-01-26
3. Preferential Organization of Methacrylate Monomers and Polymer Thin Films at the Air Interface Using Femtosecond Sum Frequency Generation Spectroscopy;The Journal of Physical Chemistry C;2015-10-29
4. Extracting chemical information from single-wavelength X-ray reflectivity data;The European Physical Journal Applied Physics;2013-04
5. Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials;Current Opinion in Colloid & Interface Science;2012-02
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