Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials-Reference-Cited by-同舟云学术

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Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials

Published:2012-02 Issue:1 Volume:17 Page:44-53
ISSN:1359-0294
Container-title:Current Opinion in Colloid & Interface Science
language:en
Short-container-title:Current Opinion in Colloid & Interface Science

Author:

Kirby B.J.,Kienzle P.A.,Maranville B.B.,Berk N.F.,Krycka J.,Heinrich F.,Majkrzak C.F.

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry,Polymers and Plastics,Physical and Theoretical Chemistry,Surfaces and Interfaces

Reference61 articles.

1. The application of the specular reflection of neutrons to the study of surfaces and interfaces;Penfold;J Phys Condens Matter,1990

2. X-ray and neutron reflectivity for the investigation of polymers;Russell;Mater Sci Rep,1990

3. Neutron scattering studies of surfaces and interfaces;Majkrzak;MRS Bull,1990

4. Magnetic depth profiling studies by polarized neutron reflection;Felcher;Physica B,1993

5. Neutron reflection study of bovine beta-casein adsorbed on OTS self-assembled monolayers;Fragneto;Science,1995

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