Quality and Reliability Assurance Systems in IBM Semiconductor Manufacturing
Author:
Publisher
IBM
Subject
General Computer Science
Link
http://xplorestaging.ieee.org/ielx5/5288520/5390469/05390481.pdf?arnumber=5390481
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Overview of Polymers for Electronic and Photonic Applications;Polymers for Electronic & Photonic Application;1993
2. Copper diffusion in amorphous thin films of 4% phosphorus‐silcate glass and hydrogenated silicon nitride;Applied Physics Letters;1992-11-02
3. A method of detecting the nature of IC defects;Microelectronics Journal;1988-05
4. Optimization-Based Design of Compensational Control Systems for Multistage Discrete Manufacturing Processes;IFAC Proceedings Volumes;1987-07
5. Bibliography of literature on computer hardware reliability;Microelectronics Reliability;1986-01
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