A review of the determination of dislocation parameters using strong- and weak-beam electron microscopy
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1989.tb02879.x/fullpdf
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4. The effect of annealing on the defect structure and electrical properties of deformed single crystals of Ge;Aristov;Phys. Stat. Sol. (a),1983a
5. Dislocations in deformed ZnSe single crystals as studied by weak-beam electron microscopy;Aristov;Phys. Stat. Sol. (a),1983b
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