A comparison of two models for the characteristic X-ray fluorescence correction in thin foil analysis-Reference-Cited by-同舟云学术

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A comparison of two models for the characteristic X-ray fluorescence correction in thin foil analysis

Published:1984-01 Issue:1 Volume:133 Page:61-67
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Twigg M. E.,Fraser H. L.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1984.tb00463.x/fullpdf

Reference9 articles.

1. The quantitative analysis of thin specimens;Cliff;J. Microsc.,1975

2. A review of on-line processing of chemical analysis data using a conventional CTEM/STEM;Nicholls;J. Microsc.,1982

3. Nockolds , C. Nasir , M.J. Cliff , G. Lorimer , G.W. 1979 X-ray fluorescence correction in thin foil analysis and direct methods for foil thickness measurement 417

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of 0.9PMN–0.1PT Dielectric Behaviour in Relation to the Nanostructure;Journal de Physique III;1997-06

2. Secondary fluorescence correction formulae for X-ray microanalysis — I Parallel-sided thin foil, wedge, and bulk specimens;Ultramicroscopy;1997-06

3. The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope;Journal of Microscopy;1995-06

4. Absorption and fluorescence corrections for X-ray analysis with large-solid-angle detectors: Thin films and spheres;Ultramicroscopy;1990-09

5. Energy dispersive X-ray microanalysis in the analytical electron microscope.;ISIJ International;1989

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