A review of on-line processing of chemical analysis data using a conventional CTEM/STEM-Reference-Cited by-同舟云学术

A review of on-line processing of chemical analysis data using a conventional CTEM/STEM

Published:1982-07 Issue:1 Volume:127 Page:119-126
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Nicholls A. W.,Jones I. P.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1982.tb00402.x/fullpdf

Reference30 articles.

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3. The influence of plural electron scattering on X-ray spatial resolution in STEM thin foil microanalysis. Quantitative microanalysis with high spatial resolution;Cliff;Metals Soc,1981

4. The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope;Doig;Phil. Mag.,1980

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