The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope-Reference-Cited by-同舟云学术

The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope

Published:1980-05 Issue:5 Volume:41 Page:761-775
ISSN:0141-8610
Container-title:Philosophical Magazine A
language:en
Short-container-title:Philosophical Magazine A

Author:

Doig P.,Lonsdale D.,Flewitt P. E. J.

Publisher

Informa UK Limited

Subject

Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/01418618008239347

Reference24 articles.

1. Electron Beam Microanalysis

2. Cooke, C. J. and Duncumb, P. Proceedings of the Fifth International Congress on X-ray Optics and Microanalysis. Edited by: Gaukler, K. H. pp.246New York: Springer-Verlag.

3. Cooke, C. J. and Openshaw, I. K. Proceedings of the Fourth National Conference of the Electron Probe Analysis Society of America. Pasedena. pp.64

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