Absorption and fluorescence corrections for X-ray analysis with large-solid-angle detectors: Thin films and spheres
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
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2. Proc. 46th Annu. EMSA Meeting;Nichols,1988
3. A comparison of two models for the characteristic X-ray fluorescence correction in thin foil analysis
4. Electron Microscopy and Analysis;Nockolds;Inst. Phys. Conf. Ser. 52,1979
5. Absorption and fluorescence corrections of characteristic x-rays from thin spheres
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A critical evaluation of the results of the 1992 round robin Microanalysis Test (EDXS and PEELS) performed by the Ile de France TEM network;Microscopy Microanalysis Microstructures;1993
2. Imaging of Atomic Columns in [110] Silicon;Proceedings, annual meeting, Electron Microscopy Society of America;1980-08
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