Studies of supported metal catalysts using high resolution secondary electron imaging in a STEM-Reference-Cited by-同舟云学术

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Studies of supported metal catalysts using high resolution secondary electron imaging in a STEM

Published:1987-07 Issue:1 Volume:147 Page:65-74
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Imeson D.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1987.tb02818.x/fullpdf

Reference10 articles.

1. High resolution secondary electron imaging in a VG HB501 STEM;Berger;Inst. Phys. Conf. Series,1985

2. New imaging methods for catalyst particles;Howie;Ultramicroscopy,1982

3. Secondary electron detection in the scanning transmission electron microscope;Imeson;Ultramicroscopy,1985

4. Study of supported ruthenium catalysts by STEM;Pennycook;J. Microsc.,1981

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