Secondary electron detection in the scanning transmission electron microscope
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Resolution in surface scanning electron microscopy of bulk samples
2. Scanning Electron Microscopy/1982;Peters,1982
3. Surface analyses by low energy SEM in ultra high vacuum
4. Nucleation, growth and the intermediate layer in Ag/Si(100) and Ag/Si(111)
5. Visualization of submonolayers and surface topography by biassed secondary electron imaging: Application to Ag layers on Si and W surfaces
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