In situelectronic probing of semiconducting nanowires in an electron microscope-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

In situelectronic probing of semiconducting nanowires in an electron microscope

Published:2015-10-26 Issue:2 Volume:262 Page:183-188
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

FAUSKE V.T.¹,ERLBECK M.B.¹,HUH J.²,KIM D.C.²³,MUNSHI A.M.³,DHEERAJ D.L.³,WEMAN H.²³,FIMLAND B.O.²³,VAN HELVOORT A.T.J.¹

Affiliation:

1. Department of Physics; Norwegian University of Science and Technology (NTNU); Trondheim Norway

2. Department of Electronics and Telecommunications; Norwegian University of Science and Technology (NTNU); Trondheim Norway

3. Department of Electronics and Telecommunications; CrayoNano AS; Trondheim Norway

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12328/fullpdf

Reference21 articles.

1. Doping incorporation paths in catalyst-free Be-doped GaAs nanowires;Casadei;Appl. Phys. Lett,2013

2. On direct-writing methods for electrically contacting GaAs and Ge nanowire devices;Chen;Appl. Phys. Lett,2010

3. Origin of the difference in the resistivity of as-grown focused-ion- and focused-electron-beam-induced Pt nanodeposits;Teresa;J. Nanomater,2009

4. Comparison of Be-doped GaAs nanowires grown by Au- and Ga-assisted molecular beam epitaxy;Dheeraj;J. Cryst. Growth,2013

5. P-doping mechanisms in catalyst-free gallium arsenide nanowires;Dufouleur;Nano Lett,2010

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bending Needles and Breaking Wires: Useful Failures in Nanowire Probing;Microscopy and Microanalysis;2023-07-22

2. Origin of Leakage Currents and Nanowire-to-Nanowire Inhomogeneity in Radial p–i–n Junction GaAs Nanowire Array Solar Cells on Si;ACS Applied Nano Materials;2023-07-21

3. Focused ion beam lithography for position-controlled nanowire growth;Nanotechnology;2023-06-01

4. Investigating the impact of SEM chamber conditions and imaging parameters on contact resistance ofin situnanoprobing;Nanotechnology;2017-07-24

5. Space-charge-limited current in nanowires;Journal of Applied Physics;2017-05-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3