Role of TiO2 Seed Layer Thickness on the Nanostructure Evolution and Phase Transformation Behavior of Sputtered PZT Thin Films During Post-Deposition Air-Annealing-Reference-Cited by-同舟云学术

Role of TiO2 Seed Layer Thickness on the Nanostructure Evolution and Phase Transformation Behavior of Sputtered PZT Thin Films During Post-Deposition Air-Annealing

Published:2011-06-24 Issue:11 Volume:94 Page:4066-4077
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J. Am. Ceram. Soc.

Author:

Bose Ankita¹,Sreemany Monjoy¹,Bysakh Sandip¹

Affiliation:

1. Electron Microscopy Section; Central Glass and Ceramic Research Institute; CSIR; Kolkata; 700032; India

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2011.04684.x/fullpdf

Reference35 articles.

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3. Orientation of Rapid Thermally Annealed Lead Zirconate Titanate Thin Films on (111) Pt Substrates;Brooks;J. Mater. Res.,1994

4. Reversibility of the Perovskite-to-Fluorite Phase Transformation in Lead-Based Thin and Ultrathin Films;Brennecka;Adv. Mater.,2008

5. TEM Characterisation of PZT Films Prepared by a Diol Route on Platinised Silicon Substrates;Kaewchinda;J. Euro. Ceram. Soc.,2000

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