Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results-Reference-Cited by-同舟云学术

Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results

Published:2013-07-24 Issue:1 Volume:252 Page:23-34
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

VILADOT D.¹,VÉRON M.²,GEMMI M.³,PEIRÓ F.⁴,PORTILLO J.⁵⁶,ESTRADÉ S.⁴⁶,MENDOZA J.⁶,LLORCA-ISERN N.¹,NICOLOPOULOS S.⁵¹

Affiliation:

1. CPCM Universitat de Barcelona; Facultat de Química, Departament de Ciencia de Materials i Enginyeria Metallúrgica; Barcelona Catalunya Spain

2. Laboratoire SIMaP; Grenoble INP - CNRS - UJF, Saint Martin d'Hères Cedex; France

3. Center for Nanotechnology Innovation@NEST; Istituto Italiano di Tecnologia; Pisa Italy

4. LENS, MIND-IN2UB; Departament d'Electrònica, Universitat de Barcelona; Barcelona Spain

5. NanoMEGAS SPRL; Brussels Belgium

6. Centres Científics i Tecnològics de la Universitat de Barcelona; Barcelona Catalunya, Spain

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12065/fullpdf

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