High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities-Reference-Cited by-同舟云学术

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High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities

Published:2024-05 Issue: Volume:259 Page:113927
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Corrêa Leonardo M.^ORCID,Ortega Eduardo,Ponce Arturo,Cotta Mônica A.,Ugarte Daniel

Publisher

Elsevier BV

Reference65 articles.

1. Nanoscale science and technology: building a big future from small things;Lieber;MRS Bull.,2003

2. Nanowire electronics: from nanoscale to macroscale;Jia;Chem. Rev.,2019

3. Vapor phase growth of semiconductor nanowires: key developments and open questions;Güniat;Chem. Rev.,2019

4. The rapidly changing face of electron microscopy;Thomas;Chem. Phys. Lett.,2015

5. Transmission Electron Microscopy: A Textbook for Materials Science;Williams,2009

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