In SituAnnealing Studies of Sol-Gel Ferroelectric Thin Films by Spectroscopic Ellipsometry
Author:
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1995.tb08908.x/fullpdf
Reference17 articles.
1. Spectroscopic Ellipsometry: A New Tool for Nondestructive Depth Profiling and Characterization of Interfaces;McMarr;J. Appl Phys.,1986
2. Microstructural Evolution of Ultrathin Amorphous Silicon Films by Real-Time Spectroscopic Ellipsometry;An;Phys. Rev. Lett.,1990
3. Determination of the Optical Function n(λ) of Vitreous Silica by Spectroscopic Ellipsometry with an Achromatic Compensator;Chindaudom;Appl. Opt.,1993
4. Optical Characterization of Inhomogeneous Transparent Films on Transparent Substrates by Spectroscopic Ellipsometry
5. Spectroscopic Ellipsometry Studies on Ion-Beam-Sputtered Pb(Zr,Ti)O3 Films on Sapphire and Pt-Coated Silicon Substrates;Trolier-McKinstry;Thin Solid Films,1993
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