Optical Characterization of Inhomogeneous Transparent Films on Transparent Substrates by Spectroscopic Ellipsometry
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Elsevier
Reference67 articles.
1. Refractive index and inhomogeneity of thin films;Borgogno;Appl. Opt.,1984
2. Automatic determination of the optical constants of inhomogeneous thin films;Borgogno;Appl. Opt.,1982
3. Multiple determination of the optical constants of thin-film coating materials;Arndt;Appl. Opt.,1984
4. Analysis of inhomogeneous thin films by spectro-photometric measurements;Piegari;Thin Solid Films,1989
5. Systematic and random errors in rotating-analyzer ellipsometry;De Nijs;J. Opt. Soc. Am. A,1988
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