Use of permanent marker to deposit a protection layer against FIB damage in TEM specimen preparation
Author:
Affiliation:
1. National Nanofab Center (NNFC); Daejeon South Korea
2. Korea Research Institute of Standards and Science (KRISS); Daejeon South Korea
3. Division of Advanced Materials Engineering; Chonbuk National University (CBNU); Jeonju South Korea
Funder
KRISS program
IT R&D program of the MKE/KEIT
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12150/fullpdf
Reference19 articles.
1. Quantitative HRTEM analysis of FIB prepared specimens;Baram;J. Microsc.,2008
2. Minimizing damage during FIB sample preparation of soft materials;Bassim;J. Micros.,2012
3. EELS analysis of vacuum arc-deposited diamond-like films;Berger;Philos. Mag. Lett.,1998
4. Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beam;Cairney;Micron,2003
5. A review of focused ion beam milling techniques for TEM specimen preparation;Giannuzzi;Micron,1999
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