Redeposition effects in transmission electron microscope specimens of FeAl–WC composites prepared using a focused ion beam

Author:

Cairney J.M.,Munroe P.R.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference33 articles.

1. FIBXTEM—focused ion beam milling for TEM sample preparation;Basile;MRS Symp. Proc.,1992

2. Radiation damage in ion-milled specimens: characteristics, effects and methods of damage limitation;Brown;Radiat. Eff.,1986

3. Redeposition effects in TEM sample preparation of FeAl-based metal matrix composites using the focused ion beam miller;Cairney;Proc. Microsc. Microanal.,2000

4. Preparation of transmission electron microscope specimens from FeAl and WC powders using focused ion beam milling;Cairney;Mater. Character.,2001

5. Redeposition effects in TEM specimens of composites prepared using a focused ion beam miller;Cairney;Proc. 15th Int. Conf. Electron Microsc.,2002

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