A Method of Fabricating Electroplated Structures using Side-wall Electrical Contact
Author:
Affiliation:
1. Hitachi, Ltd., Hitachi Research Laboratory
2. Hitachi, Ltd., Central Research Laboratory
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering,Mechanical Engineering
Link
https://www.jstage.jst.go.jp/article/ieejsmas/134/2/134_20/_pdf
Reference9 articles.
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3. (3) J. Gobet, F. Cardot, J. Bergqvist, and F. Rudolf : “Electrodeposition of 3D microstructures on Silicon”, J. Micromech. Microeng., 3, pp. 123-130 (1993)
4. (4) B.-H. Kim, B.-J. Park, B.-H. Kum, and J.-B. Kim : A MEMS Probe Card with High Aspect Ratio Electroplated Posts, Microprocesses and Nanotechnology, pp. 482-483 (2007)
5. (5) J. Voldman, M. Toner, M. L. Gray, and M. A. Schmidt : “A Dielectrophoresis-based Array Cytometer”, TRANSDUCERS'01 & EUROSENSORS XV, pp. 322-325 (2001)
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