Analysis of Quantum Confinement in Nanosheet FETs by Using a Quantum Drift Diffusion Model
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Published:2022-11-01
Issue:11
Volume:142
Page:1174-1179
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ISSN:0385-4221
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Container-title:IEEJ Transactions on Electronics, Information and Systems
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language:en
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Short-container-title:IEEJ Trans.EIS
Author:
Matsuda Masashi1, Hiroki Akira1
Affiliation:
1. Graduate School of Science and Technology, Kyoto Institute of Technology
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Reference15 articles.
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