Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem-Reference-Cited by-同舟云学术

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Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem

Published:2006-03-01 Issue:7 Volume:45 Page:1312
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Lemarchand Fabien,Deumié Carole,Zerrad Myriam,Abel-Tiberini Laëtitia,Bertussi Bertrand,Georges Gaëlle,Lazaridès Basile,Cathelinaud Michel,Lequime Michel,Amra Claude

Publisher

The Optical Society

Reference9 articles.

1. An improved method for the determination of the extinction coefficient of thin film materials

2. Multiscale roughness in optical multilayers: atomic force microscopy and light scattering

3. Quantitative Microroughness Analysis down to the Nanometer Scale

4. Multiwavelength (045–106 μm) angle-resolved scatterometer or how to extend the optical window

5. Light scattering from multilayer optics I Tools of investigation

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3. A system for measuring surface roughness by total integrated scattering;Journal of Physics D: Applied Physics;2011-12-02

4. Optical parameters of oxide films typically used in optical coating production;Applied Optics;2010-10-25

5. Optical Parameters of Oxide Films Typically Used in Optical Coating Production;Optical Interference Coatings;2010

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