Ellipsometry algorithm for absorbing films
Author:
Publisher
The Optical Society
Reference16 articles.
1. Thickness Calculations for a Transparent Film from Ellipsometric Measurements*
2. Ellipsometric method for separate measurements of n and d of a transparent film
3. In situ ellipsometric study of optical properties of ultrathin films
4. Method for numerical inversion of the ellipsometry equation for transparent films
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