Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy-Reference-Cited by-同舟云学术

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Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy

Published:1999-03-01 Issue:3 Volume:16 Page:568
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Rönnow D.,Lastras-Martı́nez L. F.,Cardona M.,Santos P. V.

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. V. On the effects of simple pressure in producing that species of crystallization which forms two oppositely polarised images, and exhibits the complementary colours by polarised light. By David Brewster, LL. D. F. R. S. Edin. and F. S. A. Edin. In a letter addressed to the Right Hon. Sir Joseph Banks, Bart. K. B. P. R. S

2. High-Stress Optical Birefringence in Pure and Degeneraten-Type Germanium

3. Dispersion of the Piezobirefringence of GaAs

4. Intrinsic Piezobirefringence of Ge, Si, and GaAs

5. A NEW TECHNIQUE FOR MEASURING MAGNITUDES OF PHOTOELASTIC TENSORS AND ITS APPLICATION TO LITHIUM NIOBATE

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1. Sensing strain-induced symmetry breaking by reflectance anisotropy spectroscopy;Applied Physics Letters;2021-10-11

2. Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction;Journal of Materials Science;2017-02-27

3. Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films;Journal of Physics D: Applied Physics;2015-09-17

4. Probing surface and interface structure using optics;Journal of Physics: Condensed Matter;2010-02-05

5. Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001);Applied Optics;2009-10-20

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