Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Recent developments in instrumentation in ellipsometry
2. Automatic rotating element ellipsometers: Calibration, operation, and real‐time applications
3. Spectroscopic ellipsometry data analysis: measured versus calculated quantities
4. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
5. Mueller matrix ellipsometry with imperfect compensators
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