Automatic rotating element ellipsometers: Calibration, operation, and real‐time applications-Reference-Cited by-同舟云学术

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Automatic rotating element ellipsometers: Calibration, operation, and real‐time applications

Published:1990-08 Issue:8 Volume:61 Page:2029-2062
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Collins R. W.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1141417

Reference177 articles.

1. ELECTROREFLECTANCE SPECTROSCOPY IN THE STUDY OF METAL-ELECTROLYTE INTERFACES

2. ELECTROREFLECTANCE SPECTROSCOPY IN THE STUDY OF METAL-ELECTROLYTE INTERFACES

3. ELECTROREFLECTANCE SPECTROSCOPY IN THE STUDY OF METAL-ELECTROLYTE INTERFACES

4. ELECTROREFLECTANCE SPECTROSCOPY IN THE STUDY OF METAL-ELECTROLYTE INTERFACES

5. Present status of automatic ellipsometers

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2. Research on spectroscopic ellipsometry in China with future challenges;Thin Solid Films;2023-01

3. Robustness enhancement of dynamic spectroscopic ellipsometry by compensating temperature dependency of the monolithic polarizing interferometer;Applied Optics;2022-09-06

4. Dynamic ellipsometry measurement based on a simplified phase-stable dual-comb system;Optics Express;2022-02-22

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